Nnnnsecondary ion mass spectrometry pdf

Sims is a surface analysis technique used to characterize the surface and subsurface region of materials and based on me ratio measurement of ejected particles under ion. The mass charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of. Mass spectra of glutamic acid via different ionization sources. Sims produces a mass spectrum of the outermost 12 nm of a. Secondaryion mass spectrometry sims is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. General secondary ion mass spectrometry timeofflight mass spectrometry instrumentation general spectral features part 2. The mass to charge ratio mz is used to describe ions observed in mass spectrometry. By convention, m is the numerical value for the mass of the ion and z is the numerical value for the charge of the ion. Cellular imaging with secondary ion mass spectrometry. Data system mass detector analyzer vacuum system source inlet region more precisely mass spectrometry determines the mass of a molecule. Alder history of mass spectrometry of organic molecules, almeria, october 2016.

Secondaryion mass spectrometry sims is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam. The surface is not destroyed due to small ion current density. Molecules with masses of up to several amu are often represented in the mass spectrum by their molecular ions or as large characteristic fragments after the loss of a functional group. Secondary ion mass spectrometry ions, the full strength of tofsims comes into play when evaluating the higher mass range of a spectrum. Detection, characterization, and analysis of contaminants, 2012. Expanding role of mass spectrometry in biotechnology. From the time of the second edition published in 2001 until now, much. Timeofflight secondary ion mass spectrometry tof sims.

Welker, in developments in surface contamination and cleaning. The second one is high spatial resolution mass spectra images. Timeofflight secondary ion mass spectrometry tofsims is a surface analysis technique that is herein demonstrated to be a viable tool for the detection of enzyme activity on solid substrates. Substanzen in geeigneter weise ionen zu erzeugen, diese ionen nach ihrer. Secondary ion mass spectrometry sims is an informationrich tool that the surface analyst can bring to bear on a biomedical problem. A mass spectrum plural spectra is a plot of the ion signal as a function of. In this chamber in several ways, ions of the compound to be. Highresolution secondary ion mass spectrometry analysis. Bombardment of a sample surface with a primary ion beam i p followed by mass spectrometry of the emitted secondary ions i s constitutes secondary ion mass spectrometry.